BSL 1717HE

Product Introduction：

It is an amorphous silicon flat panel detector used for real-time imaging. The imaging frame rate can reach 15 fps, with a 16-bit ADC configuration, high dynamic range, and good contrast. The data is transmitted through optical fibers, and the SDK software development package provided by our supports the Windows operating system, allowing you to conveniently configure parameters, calibrate, capture images, and observe images of the detector. The radiation resistant energy level of up to 15 MV makes it suitable for high-energy conventional X-ray sources and linear accelerators. With its excellent image quality, fast frame rate, and high reliability, BSL 1717HE is suitable for high-energy industrial non-destructive 2D or 3D detection applications.

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Product Description

Product Introduction：

Adopting irradiation resistant amorphous silicon TFT sensor technology
41 x 41 cm ² Imaging area
200 µ m pixel size
16-bit ADC, high dynamic range
Gigabit Ethernet interface, no frame loss for images
High detection efficiency
The software is easy to use and facilitates system integration
Multi-level adjustable gain
Editable ROI

Parameters

Detector type	a-Si TFT	X-ray energy range	40 kV ~ 15MV
Scintillator type	Csl / DRZ-Plus / PI200	Protection level	IP65
Pixel size（ μ M)	200	Size (mm³)	≤ 500 × 560 × 22
Pixel matrix	2048 × 2048	Weight (kg)	7.5
Effective imaging area (mm²)	410 × 410	power dissipation (W)	15
Spatial resolution (lp/mm)	2.5	Operating temperature (℃)	10~40
AD conversion bits	16	Storage temperature (℃)	-10~55
Frame rate (fps)	7.5 (1×1) 15 (2×2)	Operating humidity (% RH)	20~90 ( No condensation )
data interface	Gigabit Ethernet	Storage humidity (% RH)	10~90 ( No condensation )
Trigger mode	Continuous acquisition, pulse synchronization

BSL 1717HE

Product Introduction：

Product Introduction：

Parameters

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